Texas Instruments (TI) has rolled out a tiny 24-bit wideband analog-to-digital converter (ADC) designed for data acquisition for a range of industrial systems.
The ADS127L11 offered in a 50% smaller package is optimized for low power consumption, resolution and measurement bandwidth.
The wideband and low-latency filter options of the ADC allows for improved AC measurement resolution with 50% wider bandwidth, data rates as high as 400 kSPS and a 30% higher signal-to-noise ration than competing data converters, TI said.
In low-latency mode, the ADS12711 delivers 25% lower latency at up to 1,067 kSPS and 83.3% lower offset drift for improvement of DC measurement resolution, data throughput and response times in data acquisition and condition-monitoring applications.
The ADC eliminates a trade-off where designers previously had to choose between size and measurement with the single-channel device being smaller than competing ADCs, TI said. The ADC also increases system functionality to include additional channels.
