Fast body diode MOSFET for power conversion applications

Vishay Intertechnology Inc. has unveiled a new device in its fourth generation of 600 V EF series fast body diode metal-oxide semiconductor field-effect transistors (MOSFETs).

Providing high efficiency for telecom, industrial, computing and enterprise power supply applications, the Vishay Siliconix n-channel SiHH070N60EF slashes on-resistance by 29% compared with previous-generation devices while delivering 60% lower gate charge. This results in the industry’s lowest on-resistance times gate charge for devices in the same class, a key figure of merit (FOM) for 600 V MOSFETs used in power conversion Source: Vishay Intertechnology Inc.applications.

Vishay offers a broad line of MOSFET technologies that support all stages of the power conversion process, from high voltage inputs to the low voltage outputs required to power the latest high tech equipment. With the SiHH070N60EF and upcoming devices in the fourth-generation 600 V EF series family, the company is addressing the need for efficiency and power density improvements in two of the first stages of the power system architecture — totem-pole bridgeless power factor correction (PFC) and soft-switched DC/DC converter topologies.

Built on Vishay’s latest energy-efficient E series superjunction technology, the SiHH070N60EF features low typical on-resistance of 0.061 Ω at 10 V and ultra low gate charge down to 50 nC. The device’s FOM of 3.1 Ω*nC is 30% lower than the closest competing MOSFET in the same class. These values translate into reduced conduction and switching losses to save energy. For improved switching performance in zero voltage switching (ZVS) topologies such as LLC resonant converters, the SiHH070N60EF provides low effective output capacitances C_o(er) and C_o(tr) of 90 pf and 560 pF, respectively. The device’s C_o(tr) is 32% lower than the closest competing MOSFET in the same class.

Offered in the PowerPAK 8x8 package, the device is RoHS-compliant, halogen-free and designed to withstand overvoltage transients in avalanche mode with guaranteed limits through 100% UIS testing.