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Image Sensors That Improve Quality in Light Starved Conditions

10 April 2017

ON’s IT-EMCCD image sensors. Image credit: ON Semiconductor ON’s IT-EMCCD image sensors. Image credit: ON Semiconductor

ON Semiconductor has expanded its portfolio of interline transfer electronic multiplication CCD (IT-EMCCD) image sensors that double the light gathering capability and improve image quality under light starved conditions.

The image sensors are targeted at low-light industrial applications such as medical and scientific imaging as well as commercial and military applications for high-end surveillance. The 4 megapixel KAE-04471 sensor uses larger 7.4 micron pixels than existing IT-EMCCD devices while being pin compatible with the existing 8 megapixel KAE-08151 image sensor.

While EMCCD image sensors excel under low-light conditions, they have not been available as low resolution devices with limited dynamic range historically. The low-noise architecture of ON’s IT-EMCCD sensors can be extended to multi-megapixel resolutions. The output design allows both standard CCD and EMCCD outputs to be utilized for a single image capture—extending dynamic range and scene detection from sunlight to starlight in a single image.

Engineering grade versions of the image sensors are available now with production versions available in the second quarter of this year.

To contact the author of this article, email PBrown@globalspec.com


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