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New tool simplifies testing for IoT wireless tags

27 August 2026
A reel-to-reel production of IoT wireless tags. The collaboration between Wiliot and CISC is enabling easier testing of each tag in production environments. Source: Wiliot

Internet of things (IoT) wireless tag vendor Wiliot is partnering with CISC Semiconductor to enable easier testing of each battery-free IoT tag in production environments.

CISC has optimized its BLE Xplorer testing solution for Wiliot’s IoT tags and it will be integrated into the Wiliot’s physical AI platform. The devices could be integrated into reel-to-reel production equipment or deployed as a dedicated offline tester.

Wiliot said this gives tag and label makers a standardized testing capability for a range of production methods.

The company said that testing of these IoT tags is complex and often requires suppliers to develop custom equipment and processes before manufacturing begins. CISC’s BLE Xplorer tool is a repeatable testing approach to accelerate onboarding and expand manufacturing of the tags.

On a single station, testing speeds of up to 6,500 units per hour, per lane, are supported. Wiliot said this is more than four times the 1,500 units per hour supported by a stop-and-go testing station. The system performs an individual pass-or-fail result to every unit allowing vendors to test 100% of the IoT tags.

Called IoT Pixels, Wiliot’s tags can be used across a range of applications like:

  • Retail
  • Grocery
  • Food and beverage
  • Post-and-parcel
  • Logistics
  • Transportation

The tags provide accurate inventory, protect sensitive data, are reusable assets and reduce waste, the company said.

To contact the author of this article, email PBrown@globalspec.com


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