MEMS and Sensors

Low Noise MEMS Accelerometers for Condition Monitoring

24 April 2017

New MEMS accelerometers from Analog Devices, Inc. deliver the high resolution vibration measurements necessary for early detection of bearing faults and other common causes of machine failure. The ADXL1001 and ADXL1002 MEMS high frequency, low noise MEMS accelerometers are designed explicitly for industrial condition monitoring applications.

Previously available high frequency MEMS accelerometers suffered from inadequate noise performance compared with legacy technology. The ADXL1001/ADXL1002 devices feature noise performance over high frequencies on par with available PZT (lead zirconate titanate) technology, making them an attractive option for new condition monitoring products. The technology provides high quality and accurate data for Smart Factory IoT applications, enabling intelligent sensing from the edge of the network.

ADXL1001/ADXL1002 MEMS accelerometers deliver ultra-low noise density over an extended bandwidth with high-g range. The accelerometers are available in two models, with full-scale ranges of ±100g (ADXL1001) and ±50g (ADXL1002). Typical noise density for the ADXL1002 is 25 μg/√Hz, with a sensitivity of 40mV/g, and 30 μg/√Hz for ADXL1001, with sensitivity 20mV/g. Both accelerometers operate on single voltage supply from 3.0V to 5.25V, and offer useful features such as complete, electrostatic self-test and over range indicator. The ADXL1001/ADXL1002 are available in a 5 mm × 5 mm × 1.85 mm LFCSP package and are rated for operation over a -40° C (104° F) to +125° C (257° F) temperature range.

Product Pricing and Availability

ProductOutput InterfaceFull-scale RangeProduct AvailabilityPrice Each per 1,000Packaging
ADXL1001Analog±100

g

Now$29.6132 lead 5×5 mm LFCSP
ADXL1002Analog±50

g

Now$29.6132 lead 5×5 mm LFCSP


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