The 9812DX 1/f noise test system from ProPlus has been updated in concert with the introduction of the FS-Pro Series, an artificial intelligence-driven semiconductor parameter analyzer. The 9812DX is now equipped with a built-in smart source measure unit which improves DC test speed by five times and doubles noise test speed.
Source: ProPlusThe 9812DX supports a complete range of measurement conditions for both high and low impedance devices. The system also sets a high-speed record, with a typical noise measurement speed of 10 sec/bias, enabling fast and accurate noise characterization to meet the needs of process quality monitoring, statistical noise analysis and advanced circuit designs.
The FS-Pro semiconductor parameter analyzer is a fully integrated IV, CV and 1/f noise test instrument designed for a range of test applications on semiconductor devices, circuits, LED materials, 2D devices and nanomaterials. The four-channel unit weighs only 7.8 kg and can be expanded to 100 channels, each with full functions of IV, CV and 1/f noise tests.
Register to attend an FS-Pro online forum on June 18 to learn more about these upgraded products.
