FormFactor, Inc, a provider of radio frequency (RF) probe stations and probe cards, and Rohde & Schwarz, a global leader in test and measurement, have announced a strategic co-marketing partnership as part of FormFactor’s MeasureOne partner program, a solution-integration initiative designed to deliver validated, turnkey on-wafer test systems. The collaboration combines advanced probing technology from FormFactor with industry-leading RF test instrumentation from Rohde & Schwarz, providing manufacturers with comprehensive solutions spanning early design verification through production.
With RF device complexity and operating frequencies continuing to increase, this expanded collaboration formalizes a tightly integrated on‑wafer test solution designed to lower integration effort and risk, reduce overall cost, and accelerate time-to-market for customers across development and production.
R&S ZNA VNA performing on-wafer measurements together with FormFactor SUMMIT200 probe system. Source: FormFactor
Reduced costs and faster time-to-market
On-wafer device characterization of RF components such as 5G frontends or filters enables design validation during development, as well as product qualification and verification in production. Identifying faulty devices before packaging can significantly help reduce costs and improve yield. Through their integrated solutions, Rohde & Schwarz and FormFactor help manufacturers detect issues early in the process, which can result in faster time-to-market.
Seamlessly integrated test solutions
Rohde & Schwarz and FormFactor have been working together for several years to deliver powerful, seamlessly integrated solutions. Rohde & Schwarz provides instruments like the R&S ZNA, a versatile high-end vector network analyzer (VNA) capable of measuring all key RF parameters, which can easily be combined with frequency converters extending frequencies up to the THz range. FormFactor complements this with a comprehensive portfolio of manual, semi-automated and fully automated probe systems, including advanced thermal control, high-frequency probes, precision probe positioners and robust calibration tools.
This combined approach allows manufacturers to validate product performance directly during wafer runs, leveraging the expertise of both companies. The tight integration of hardware and software components from both companies is designed to enable fast and reliable testing. The complete solution includes advanced instruments, reliable wafer and die fixturing, and high-precision probe positioning throughout the entire test cycle, strengthening confidence in product quality and performance.
Jens Klattenhoff, SVP and GM of the Systems Business Unit at FormFactor, said: “By expanding our collaboration with Rohde & Schwarz through the MeasureOne program, we are delivering integrated on‑wafer RF test solutions designed to help customers reduce risk, improve efficiency and accelerate development. This partnership brings together advanced wafer probing and proven RF measurement technologies to address the growing complexity of next‑generation semiconductor devices.”
Michael Fischlein, vice president spectrum and network analyzers, EMC and antenna test at Rohde & Schwarz, stated: “We are delighted to be part of MeasureOne, a strategic co-marketing partner program that unites FormFactor — one of the world’s leading probe station providers — with Rohde & Schwarz, a global leader in test and measurement. Together, we are set up to deliver turnkey on-wafer solutions enabling crucial and demanding test capabilities for next generation semiconductors.”
The MeasureOne partnership encompasses a wide range of Rohde & Schwarz instruments, including the R&S ZNA, R&S ZNB, R&S ZNBT, R&S ZVA and R&S ZNL VNA families, alongside signal and spectrum analyzers such as the FSW, FSWX , R&S FSV3000 and R&S FSVA3000. Integration also extends to signal generators ( R&S SMA100B , R&S SMB100B, R&S SGS100A, R&S SGU100A) and selected frontends and converters for advanced calibration workflows, all working seamlessly with FormFactor’s traditional plus specialty probe stations for cryogenic and vacuum applications.
