FormFactor, an electrical test and measurement supplier to the semiconductor industry, and T.I.P.S. Messtechnik GmbH (T.I.P.S.), a supplier of specialized high voltage, high current probe cards, have partnered to provide test and measurement solutions for high power devices, specifically those in electric (EV) and hybrid electric vehicles (HEVs).
Power semiconductor manufacturers are using silicon carbide and gallium nitride which can operate at higher voltages, temperatures and frequencies with improved efficiency and reliability to meet the needs of the EV and HEV markets.
“FormFactor has developed specialized application layers for our industry-leading 200 mm and 300 mm high-power probe systems to support the unique test requirements of high power semiconductor devices utilizing T.I.P.S. high-voltage anti-arcing probe cards,” stated Claus Dietrich, VP and GM of the Systems Business Unit at FormFactor. The solution developed through this partnership provides customers with “a simple and safe 
way to make semi-automated and fully-automated high power device characterization measurements,” and enables the company to meet its customers’ “most challenging requirements,” he said.
The T.I.P.S high voltage ‘LuPo‘ probe cards with flashover suppression technology “increase the breakdown voltage of the test environment, preventing arcing and flashover during on wafer high-voltage measurements,” said Dr. Rainer Gaggl, managing director at T.I.P.S.
FormFactor’s test and measurement technologies cover the full IC life cycle, including metrology and inspection, characterization, modeling, reliability, design debug, qualification and production test. The company’s products and services optimize device performance and advance to accelerate profitability.
T.I.P.S. specialists support products through research and development, engineering and design, production and after-sales maintenance and support.
The partnership is part of MeasureOne, FormFactor’s program to deliver performance-validated, integrated solutions for test and measurement applications.
