A stress test module specifically for perovskite solar cells has been added to the Paios compact optoelectrical characterization tool developed by Swiss research and development instrument manufacturer Fluxim. The Paios system has been used for electrical and optical characterization of organic, perovskite, dye-sensitized and other thin film solar cell architectures since 2012.
The new module engineered for perovskite solar cell degradation tests supports advanced characterizations in DC, AC and transient mode. Data acquisition is supported and managed by the pre-installed software. The
Source: Fluxim stress applied to the solar cells can be voltage, current or maximum power point tracking, and the illumination and temperature levels can be controlled in the compact system.
Typically used within a glovebox or inside a chamber with a controlled atmosphere, Paios is used for a wide range of measurements, for example current-voltage, impedance spectroscopy, charge extraction by linearly increasing voltage, intensity modulated photovoltage spectroscopy and deep-level transient spectroscopy.
System add-ons include an automated custom probe station, variable LED sources and detectors, as well as cryostats and a spectrometer.
