Industrial Electronics

Anritsu introduces Tensor VNA, redefining high performance RF and microwave network analysis

04 August 2026

Anritsu Corporation announces the launch of its new Tensor Vector Network Analyzer (VNA). The Tensor VNA represents a major advancement in radio frequency (RF) and microwave network analysis, delivering modern, scalable architecture designed to support the most complete and demanding measurements like amplifiers, filters, frequency convertors (mixers — single stage and multistage), opto-electronics and other advanced VNA measurements.

Unveiled to the global RF and microwave community at the IEEE MTT S International Microwave Symposium during June 2026 in Boston, Massachusetts, the Tensor VNA is engineered to meet the evolving requirements for aerospace and defense, semiconductor, active and passive device measurements, signal integrity, research and development, and millimeter wave/waveguide system development.

Key differentiators and platform highlights

Source: Anritsu CorporationSource: Anritsu Corporation

The Tensor VNA has been designed from the ground up to address measurement complexity, speed and accuracy challenges faced by today’s engineers. Key highlights include:

  • One source-per-port architecture, which means four sources for a four port VNA, which not only enables multiple measurements with the same setup (multiple amplifiers/mixers/multistage mixers), but also provides the industry’s best specifications related to output power and dynamic range.
  • Inbuilt AI engine that helps in making complex measurements in an easy and intuitive fashion. Tensor VNA works as a companion with the user rather than just being a measurement tool. It helps users with suggestions and understands human language to make it a user-friendly environment.
  • Ultrafast sweep speed and data transfer rates with a modern software architecture to support complex measurements to be made with ease.
  • Most advanced hardware for a next generation VNA platform hardware optimized for high dynamic range, low trace noise and repeatable measurement performance across wide frequency spans. The only VNA in the world that offers one source-per-port as a default, so that customers can use even two port VNAs to make amplifier two-tone measurements or with a four port VNA can make 2-2 tone amplifier/mixer measurements. The hardware also comes with an option to have the 2nd local oscillator (LO) which provides vector mixer measurements (phase, group delay, etc.).
  • Scalable, flexible configuration with no additional test sets or hardware for supporting various configurations. Supports a broad range of test configurations to accommodate diverse applications, from device level characterization to complex multi-port system measurements, banded waveguide measurements to high-speed signal integrity applications.

High frequency and mmWave readiness

Tensor VNA can support high frequencies from 54 GHz to 220 GHz with Anritsu’s small compact mmWave modules and at the same time perform waveguide banded measurements with most third party vendors for higher frequencies up to 1.1 THz.

  • Accelerated test throughput
    Optimized measurement speed and workflow efficiency help engineers reduce test time while maintaining confidence in results, from R&D through validation and production environments.
  • Modern user interface and automation support
    An intuitive operating environment and automation capabilities streamline test setup, analysis and integration into existing measurement workflows.

“The introduction of the Tensor VNA marks a major milestone in Anritsu’s network analyzer roadmap,” said Navneet Kataria, Anritsu marketing director. “As device performance and system complexity continue to increase, engineers need tools that deliver trusted results while adapting to rapidly changing test requirements. Tensor was designed to do exactly that.”

The Tensor VNA expands Anritsu’s industry-leading portfolio of RF, microwave, millimeter wave and sub THz test solutions, reinforcing the company’s long-standing commitment to precision measurement and technology leadership.

To contact the author of this article, email GlobalSpecEditors@globalspec.com


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