Semiconductor test operations on automated test equipment produce large amounts of data for use during the validation and high-volume manufacturing test processes. A new open architecture system from Teradyne brings real-time analytics to semiconductor test, optimizing test flow and yield, and lowering costs while reducing the security risks present with cloud-based solutions.
The Archimedes solution integrates seamlessly with leading data analytics platforms, speeding time to analysis. Teradyne UltraEdge2000, an integral part of the Archimedes program, is a secure, high-performance, parallel-compute platform that executes real-time analytics solutions with millisecond latency. It delivers a natively secure environment that performs data consumption and heavy computational processes in real-time at the edge of the network, reducing exposure to the security risks present with cloud-based solutions and on-tester agents. This approach ensures the safety of data, analytic models and rule sets.
Source: Teradyne
Archimedes offers access to a larger set of trusted and consistently structured data types, providing greater flexibility and ensuring data integrity. delivers a bi-directional data stream is delivered to enable in-situ, real-time data analytics, pushing results back to the tester for immediate test program optimizations that improve quality and yield.
