Teradyne has launched an open architecture that brings real-time analytics to semiconductor testing to help speed up time to analysis.
Called Teradyne Archimedes, the semiconductor test solution optimizes test flow and yield while lowering costs and reducing security risks with cloud-based offerings.
“Demand for higher-quality semiconductor devices that use advanced processes is increasing the complexity of semiconductor manufacturing — and only comprehensive test and analytics solutions can help address this,” said Regan Mills, vice president of marketing and general manager, Semiconductor Test Division, Teradyne. “Offering an open architecture that lets our customers choose the most effective data analytics solutions for their environment, Teradyne Archimedes helps identify failures and their root causes, allowing corrective actions to be taken, both before and during high-volume manufacturing.”
Teradyne Archimedes employs diverse data formats, specification and interface requirements. The testing system requires on-tester agents to achieve compatibility with automated test solutions. This approach with other analytics solutions relies on the cloud and may slow down tester operations and expose critical test data, Teradyne said.
Moving these analytics to the system edge mitigates these vulnerabilities, the company said.
