A new release of the Double Pulse Test (WBG-DPT) solution from Tektronix Inc., is aimed at supporting the wide bandgap switching devices currently enabling significant advances in electric vehicles, solar energy and industrial controls. According to a press release from the company, the Tektronix WBG-DPT solution has the ability to provide automated, repeatable and accurate measurements on wide bandgap devices such as SiC and GaN MOSFETs.
Double pulse testing software, shown here running on the Tektronix 5 Series MSO, automates key validation measurements on GaN and SiC power converters. Source: Tektronix Inc.That may translate to quicker and more confident optimization for designers of next-generation power converters. The solution runs on Tektronix 4, 5 and 6 series mixed signal oscilloscopes (MSOs), integrating seamlessly into their measurement systems.
Tektronix adds that the solution features several industry-first measurement capabilities, including an automatic WBG de-skew technique and reverse recovery timing plots.
Automatic de-skew
To achieve meaningful energy loss measurements, designers must correct for delays introduced by test fixtures and probes. The traditional technique for aligning drain-to-source-voltage (VDS) and drain current (ID) measurements requires rewiring the test setup and careful pretest measurements.
By contrast, the WBG-DPT solution’s de-skew technique eliminates the need for rewiring and may even be performed after double pulse measurements have been taken. To simulate the effects of delays in the test setup, the software generates an alignment waveform; an engineer can then adjust a few settings to match the alignment waveform with the measured waveform, allowing the software to correct any differences in delays. Tektronix says the new process reduces the de-skew time from an hour or more to just 5 to 10 minutes.
Reverse recovery plotting
In addition, the reverse recovery timing plots of the WBG-DPT solution make it easier for engineers to see reverse recovery details for multiple pulses overlaid on a single display. Measurements are designed to align with JEDEC and IEC standards for double pulse testing and diode reverse recovery; users can configure measurements to query results on every first or second pulse, or all pulses of a double pulse set. This unique approach to reverse recovery plotting allows for multiple double pulse sets and provides visual and measurement results on each set. The measurement provides the ability to easily zoom in on the reverse recovery region and even debug reverse recovery parameters of the system.
“Tektronix customers are the designers of the next generation of cutting-edge power electronics technology, and their designs must be optimized to balance efficiency, size and reliability,” said Daryl Ellis, general manager for the Tektronix Mainstream Portfolio. “We are confident that the design of the Tektronix WBG-DPT Solution will allow for simplified debugging, repeatable measurements (per JEDEC and IEC standards) and a faster learning curve. Test automation reduces test times and retesting errors, ensuring our customers meet their project timelines and time to market plans.”
