Plated Probe Tailored for Fine Pitch PCB Assembly Test

Printed circuit board (PCB) assembly test services provider Everett Charles Technologies (ECT), an Xcerra company, has added a new lead-free-plated probe to its portfolio of test probes. Designated LFRE-39, the plated spring probe is tailored for the demanding requirements of high- volume production in-circuit and functional tests. As a result, it can meet the fine pitch requirements of PCB assembly test applications down to 39 mils (1.0 mm). According to the maker, proprietary lead-free (LFRE)-plated probes are field proven to provide enhanced performance in high-volume production test environments. Additionally, due to their excellent hardness, the LFRE-plated probes are less prone to solder transfer and tip wear. Typically lead-free solder and organic solderability preservatives-treated copper pads on boards present a harder or more coarse contact surface, causing unwanted plating and probe tip wear. Consequently LFRE-plated probes have demonstrated longer life and mean time between maintenance on many challenging test applications, claims the supplier.