In announcing the launch of three new testing solutions, Tektronix said it is helping to drive the future of data transfer.
The news comes within the context of the vastly increased importance of videoconferencing during the COVID-19 pandemic, as well as the ongoing demand for ever-faster data downloads. Next-generation technologies will be driven by large, rapid data transfers and low-latency video displays. Tektronix’s contributions to this landscape include automated compliance and debugging solutions for three high-speed serial data standards: USB4, Thunderbolt 4 (TBT4) and DisplayPort 2.0 (DP2.0).
The new USB4 standard increases data transfer rates up to eight times faster than the USB 3.0 standard, delivering fast and secure 100 W USB-C charging. DP2.0, the standard currently slated for the second half of 2021, is also set to triple data bandwidth performance over the existing DisplayPort 1.4, offering 16 K video resolution, higher refresh rates and improved user experience with augmented/virtual reality (AR/VR) displays.
According to a press release, the new solutions address the most common challenges design engineers face, including test time, signal integrity and device under test (DUT) control. They also offer physical layer electrical testing and characterization for compliance with evolving USB-C connector standards. The solutions are designed to easily integrate into custom test environments, enabling USB4 testing and debugging for any device with a USB4 or TBT4 port — including laptops, tablets, cell phones and televisions. Up to six devices can be connected in parallel.
Design automation company Synopsys has leveraged Tektronix technology for work on semiconductor chip design. “When using the TekExpress DisplayPort 2.0 Tool, we were not only able to understand how to meet compliance, but we were also able to debug and understand the limits of our physical layer,” said Andre Merlo, a senior test engineer at Synopsys.
The new offerings include:
- Compliant with the USB4 Specification Ver1.0 and USB4 Router Assembly Electrical Compliance Test Specification Rev 1.0
- Completes both Lane 0 and Lane 1 Transmitter tests without flipping the USB Type-C connector or USB4 high-speed fixture
TBT3 and TBT4 solutions
- Supports all four data rates (10 G, 10.3 G, 20 G and 20.6 G)
- Provides automatic DUT control support for both TenLira/TDT (Intel's scripts) and USB4 ETT
- Pre-compliance solution with Tektronix's proposed measurement for ultra high bit rate (UHBR) speeds
- Supports the P76xx tri-mode probe with multiple probe tip options
In addition, the TekExpress software automation framework developed by Tektronix for one-button, automated testing validates compliance patterns to ensure result accuracy, and supports offline analysis and baseline for future specification changes.
The solutions are now available for use with DPO/MSO70000SX/DX oscilloscopes with 23 GHz bandwidth and above, and 100 GS/s sample rate. The scope setup can additionally be used for testing existing USB2.0, USB3.2, DP1.2 and DP1.4 standards.