Semiconductor Equipment

New test platform modules for small currents, fast processing speeds

16 December 2020
The 500MDM (top) and DPS32A are two new modules designed to boost the capabilities of the Advantest T2000 test platform. Source: Advantest

Two new general-purpose hardware instruments have just been introduced by semiconductor test equipment supplier Advantest Corp., both of which boost the modular architecture capabilities of the company’s T2000 test platform.

The new 500MDM is a 128-channel, air-cooled digital module, capable of handling devices with data rates up to 500 Mbps. In addition to its 32 Gbit scan pattern memory, the module features a dedicated high-performance parametric measurement unit for every 32 I/O channels, giving the system an expanded current capacity up to 60 milliamperes (mA) for every I/O channel.

This is complemented by the new 32-amp DPS32A device power supply module, which can deliver a one-amp current load and four volts of power across 32 channels. Its high-resolution parametric measurements and continuous sampling function enable a new test methodology of delta IDDQ measurement and IDD spectrum measurement. With the ability to measure ultra-low stand-by currents, the DPS32A represents an upgrade to its predecessor, the DPS500mA.

Advantest said semiconductor devices being mass-produced for today's mobile electronics markets run on low power to enable longer battery life. Testing these ICs requires the accommodation of small currents and fast processing speeds along with highly accurate parametric measurements, a highly accurate voltage-output resource and deep scan pattern memories.

The new units extend the capabilities of the T2000 test platform to serve the needs of integrated device manufacturers (IDMs), foundries and fabless semiconductor companies making IoT-enabled products such as wearable electronics. Applications include system-on-a-chip (SoC) devices, power-management ICs, automotive devices and CMOS image sensors.

Both new hardware units can also be retrofitted onto existing test systems — including the T2000 AiR, a compact air-cooled test platform optimized for cost-efficient testing in R&D and volume production. In addition to the flexibility of modular design, the T2000 AiR benefits from not requiring water cooling: It is possible to install it anywhere.

To contact the author of this article, email engineering360editors@globalspec.com


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