Test and measurement techniques and capabilities are constantly evolving to keep pace with innovation in the electronics realm. Here are a few recent developments.
Pickering tool update
RF engineers may already be familiar with the Microwave Switch Design Tool (MSDT) from Pickering Interfaces, which the company describes as a free online tool for configuring application-specific PXI and LXI RF and microwave switching subsystems with just a few clicks. A recent update to the tool, which debuted at European Microwave Week 2024 in September, endows the tool with schematic design and simulation capabilities that seamlessly integrate with the existing panel configurator. This allows users to go directly from an electrical schematic diagram with verified RF performance to a mechanical layout, and to design custom RF switching subsystems with an immediate visual indication of electrical performance.
Pickering notes that the tool’s support for schematic diagram generation includes interconnect cabling and circuit simulation of individual components and the full signal path, as well as mechanical design through the creation of front and rear panels. The MSDT provides access to large range of RF and microwave components, and alternate items can be requested for inclusion in the component database.
5G FWA testing services
The increasing adoption of 5G Fixed Wireless Access (FWA), which enables broadband access using radio frequencies instead of cables, is spurring a growing demand for rigorous network performance evaluation. To enable CSPs and device manufacturers to better optimize quality of experience (QoE) and differentiate their offerings in an increasingly competitive market, Spirent has announced new 5G FWA testing services for comprehensive, lab-based 5G/Wi-Fi gateway testing and live network competitive benchmarking. These solutions deliver actionable insights through extensive testing across multiple user scenarios including general data and web browsing, voice over Wi-Fi, video streaming QoE, cloud gaming QoE, and RF environment characterization.
Because its benchmark testing is tailored to the specific needs of each provider, Spirent adds, it reflects real-world user experience and allows quick and accurate targeting of areas for optimization.
Data acquisition device
Emerson has expanded its USB data acquisition (DAQ) product line with a new NI mioDAQ device that features up to 16 channels of 20-bit resolution and delivers 1 million simultaneous samples per second. The device was also designed with USB type-C connectivity for simplified setup and increased accessibility, enabling engineers to debug complex designs early in the development cycle and significantly reduce costs. In addition to desktop use, Emerson says, the device is robust enough for fully automated test benches. The hardware features up to 32 analog input channels, four high-speed analog outputs, 16 flexible digital lines, four counters and guaranteed specs for two- and 10-year calibration cycles.
“Our team listened closely to the needs of test and measurement professionals to simplify setup and save engineers precious time. The NI mioDAQ solution offers new, powerful features that provide the best-in-class data validation,” said Ritu Favre, group president of Emerson's Test and Measurement business.