Electronics and Semiconductors

Parallel parametric test system delivers high throughput and cost-effective wafer test

06 December 2021

Keysight Technologies Inc. has launched its new P9002A parallel parametric test system, which provides high throughput and cost-effective wafer test to accelerate time-to-market in R&D and lower cost-of-test in manufacturing.

The global semiconductor shortage has created a growing demand for semiconductors in the automotive Source: Keysight Technologies Inc.Source: Keysight Technologies Inc.industry, as well as digital devices and home appliances. Ongoing technology innovation in semiconductors is progressing rapidly, and the industry is facing a variety of technical challenges to adapt new materials, as well as miniaturization and 3D packaging processes. In addition, the complicated device designs to target commercial applications like 5G, data center, artificial intelligence (AI) and automotive are increasing test parameters.

To address this challenge and enable manufacturers to quickly ramp capacity, Keysight has delivered the new P9002A parallel parametric test system, which offers cost-effective wafer test with high throughput, as well as a flexible option structure for up to 100 channels parallel test resources, including test capabilities required for parametric tests at each test resource. The P9000 series provides software compatibility with SPECS software on 4080 series parametric testers, enables customers to utilize their existing test programs and test plans with data correlations.

To contact the author of this article, email engineering360editors@globalspec.com


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