Industrial Electronics

Rohde & Schwarz approved by USB-IF for USB 3.2 Gen 1 and Gen 2 transmitter and receiver compliance testing

07 June 2024

Rohde & Schwarz has received approval from the Universal Serial Bus (USB) Implementers Forum (USB-IF) for its USB 3.2 Gen 1 and Gen 2 transmitter (Tx) and receiver (Rx) compliance test solution. This approval underlines the company’s commitment to providing high-quality test and measurement solutions for the USB ecosystem.

The R&S RTP oscilloscope supports USB 3.2 Gen 1&2 transmitter and receiver compliance approved by the USB-IF. Source: Rohde & SchwarzThe R&S RTP oscilloscope supports USB 3.2 Gen 1&2 transmitter and receiver compliance approved by the USB-IF. Source: Rohde & Schwarz

The R&S RTP-K101 for Tx and R&S RTP-K102 for Rx enables manufacturers to test their USB devices for compliance with the USB 3.2 standard, using the R&S RTP oscilloscope from Rohde & Schwarz. The software option includes a range of test cases and scenarios that cover all aspects of electrical compliance testing of USB 3.2 Gen 1 and Gen 2 transmitters and receivers. They are implemented in the R&S ScopeSuite software, which controls all needed hardware to carry out these tests, including third-party bit error rate testers (BERT) required for receiver testing. R&S ScopeSuite features illustrated step-by-step instructions, which guide users in terms of optimum setup and connection to test fixtures to obtain reliable test results in line with USB-IF test specifications.

The USB-IF oversees the development of USB technology standards and ensures that all USB-IF certified products meet the highest standards of interoperability and quality.

The R&S RTP-K101 for Tx and R&S RTP-K102 for Rx compliance test options for USB 3.2 Gen 1 and Gen 2 are available from Rohde & Schwarz and are part of the company’s extensive solutions portfolio for USB design and compliance testing. Rohde & Schwarz already has approval from the USB-IF for USB 2.0 transmitter and receiver testing as well as for USB cable and connector testing.

To contact the author of this article, email GlobalSpecEditors@globalspec.com


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