The 0805USBN Series also offers very low DCR (0.11 to 0.63 Ohms) and current ratings up to 0.5 amps. It is available in eight impedance values to meet specific design requirements. All 0805USBN common mode chokes are halogen free and feature RoHS-compliant matte tin over nickel over silver-platinum-glass frit terminations. They have an ambient temperature rating of -40° C to +125° C.
Common Mode Chokes Have Low Profile
|23-27 Apr 2018||Oklahoma City, Oklahoma|
|18-22 Jun 2018||Honolulu, Hawaii|
In 2018, the IEEE Radar Conference arrives in vibrant Oklahoma City for the first time. Being centrally located in the US, OKC is known for great Southern cuisine, Midwestern hospitality, and a good helping of Wild West cowboy culture. Nearby Norman, OK is also the home of NOAA’s National Severe Storms Laboratory and the Advanced Radar Research Center at the University of Oklahoma, who collectively have driven much of the modern-day weather radar technology in the US. Do not miss this exciting week filled with novel radar advances and down-home fun.
For more than 30 years, the combined annual Symposia on VLSI Technology and Circuits has been the world’s premier mid-year conference for microelectronics technology, providing an opportunity for the world’s top device technologists, circuit and system designers to exchange leading-edge ideas. Held together since 1987, the Symposia on VLSI Technology and Circuits have alternated each year between sites in the US and Japan, enabling attendees to learn about new directions in the development of VLSI technology & circuit design through the industry’s leading research and development presentations.
The comprehensive technical programs at the two Symposia – fully overlapping again this year – are supplemented with short courses, invited speakers and several evening panel sessions. Since 2012, the Symposia have presented joint focus sessions that include invited and contributed papers on topics of mutual interest to both technology and circuit attendees. A single registration enables participants to attend both Symposia.